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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation
Norbert Seifert
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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation
Norbert Seifert
A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.
136 pages
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 27 de novembro de 2010 |
| ISBN13 | 9781601983947 |
| Editoras | now publishers Inc |
| Páginas | 136 |
| Dimensões | 157 × 234 × 8 mm · 199 g |
| Idioma | English |
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