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Administrative Records for Survey Methodology - Wiley Series in Survey Methodology
AY Chun
Administrative Records for Survey Methodology - Wiley Series in Survey Methodology
AY Chun
512 pages
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 15 de junho de 2021 |
ISBN13 | 9781119272045 |
Editoras | John Wiley & Sons Inc |
Páginas | 384 |
Dimensões | 240 × 160 × 27 mm · 662 g |
Idioma | English |
Editor | Chun, Asaph Young (Statistics Research Institute, Korea) |
Editor | Durrant, Gabriele (Southampton University, UK) |
Editor | Larsen, Michael D. (Saint Michael's College, United States) |
Editor | Reiter, Jerome P. (Duke University, United States) |
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