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Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition
Michael Nicolaidis
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Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition
Michael Nicolaidis
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.
336 pages, biography
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 30 de setembro de 2010 |
| ISBN13 | 9781441969927 |
| Editoras | Springer-Verlag New York Inc. |
| Páginas | 318 |
| Dimensões | 155 × 235 × 19 mm · 644 g |
| Idioma | English |
| Editor | Nicolaidis, Michael |
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