Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) - Raimund Ubar - Livros - IGI Global - 9781609602123 - 31 de março de 2011
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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1th edição

Raimund Ubar

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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1th edição

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Mídia Livros     Hardcover Book   (Livro com lombada e capa dura)
Lançado 31 de março de 2011
ISBN13 9781609602123
Editoras IGI Global
Páginas 578
Dimensões 218 × 284 × 36 mm   ·   1,61 kg
Idioma English  
Contribuidor Heinrich Theodor Vierhaus
Contribuidor Jaan Raik
Contribuidor Raimund Ubar

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