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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
66 pages
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 16 de outubro de 2015 |
ISBN13 | 9781643279107 |
Editoras | Morgan & Claypool Publishers |
Páginas | 66 |
Dimensões | 340 g |
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