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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
66 pages, colour illustrations
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 16 de outubro de 2015 |
| ISBN13 | 9781681740249 |
| Editoras | Morgan & Claypool Publishers |
| Páginas | 66 |
| Dimensões | 177 × 256 × 8 mm · 181 g |
| Idioma | English |
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