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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2021 edition
Sebastian Huhn
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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2021 edition
Sebastian Huhn
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 20 de abril de 2021 |
| ISBN13 | 9783030692087 |
| Editoras | Springer Nature Switzerland AG |
| Páginas | 164 |
| Dimensões | 439 g |
| Idioma | German |
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