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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences Softcover reprint of the original 2nd ed. 1998 edition
Ludwig Reimer
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences Softcover reprint of the original 2nd ed. 1998 edition
Ludwig Reimer
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
529 pages, biography
Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
Lançado | 1 de dezembro de 2010 |
ISBN13 | 9783642083723 |
Editoras | Springer-Verlag Berlin and Heidelberg Gm |
Páginas | 529 |
Dimensões | 241 × 161 × 33 mm · 771 g |
Idioma | English |
Contribuidor | Peter W Hawkes |
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